![](/img/cover-not-exists.png)
[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Towards a fully stand-alone analog/RF BIST: A cost-effective implementation of a neural classifier
Maliuk, Dzmitry, Kupp, Nathan, Makris, YiorgosYear:
2012
Language:
english
DOI:
10.1109/vts.2012.6231081
File:
PDF, 4.66 MB
english, 2012