[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI,...

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[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Towards a fully stand-alone analog/RF BIST: A cost-effective implementation of a neural classifier

Maliuk, Dzmitry, Kupp, Nathan, Makris, Yiorgos
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Year:
2012
Language:
english
DOI:
10.1109/vts.2012.6231081
File:
PDF, 4.66 MB
english, 2012
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