X-Ray absorption spectroscopy under conditions of total...

X-Ray absorption spectroscopy under conditions of total external reflection: application to the structural characterisation of the Cu/GaAs(100) interface

Pizzini, S., Roberts, K. J., Greaves, G. N., Barrett, N. T., Dring, I., Oldman, R. J.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
89
Year:
1990
Language:
english
Journal:
Faraday Discussions of the Chemical Society
DOI:
10.1039/dc9908900051
File:
PDF, 1.02 MB
english, 1990
Conversion to is in progress
Conversion to is failed