X-Ray absorption spectroscopy under conditions of total external reflection: application to the structural characterisation of the Cu/GaAs(100) interface
Pizzini, S., Roberts, K. J., Greaves, G. N., Barrett, N. T., Dring, I., Oldman, R. J.Volume:
89
Year:
1990
Language:
english
Journal:
Faraday Discussions of the Chemical Society
DOI:
10.1039/dc9908900051
File:
PDF, 1.02 MB
english, 1990