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[IEEE Comput. Soc. Press [1989] 1st European Test Conference - Paris, France (12-14 April 1989)] [1989] Proceedings of the 1st European Test Conference - Built-in self test using perturbed deterministic patterns
Wu, D.M., Waicukauski, J.Year:
1989
Language:
english
DOI:
10.1109/etc.1989.36269
File:
PDF, 315 KB
english, 1989