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[IEEE 2006 Design Automation Conference - San Francisco, CA, USA ()] 2006 43rd ACM/IEEE Design Automation Conference - Fault detection and diagnosis with parity trees for space compaction of test responses
Vranken, H., Kumar Goel, S., Glowatz, A., Schloeffel, J., Hapke, F.Year:
2006
Language:
english
DOI:
10.1109/dac.2006.229403
File:
PDF, 1.65 MB
english, 2006