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Radiation Test Challenges for Scaled Commercial Memories
LaBel, Kenneth A., Ladbury, Ray L., Cohn, Lewis M., Oldham, Timothy R.Volume:
55
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2008.2001481
Date:
August, 2008
File:
PDF, 2.51 MB
english, 2008