Radiation Test Challenges for Scaled Commercial Memories

IEEE Transactions on Nuclear Science 2008 / 08 Vol. 55; Iss. 4

Radiation Test Challenges for Scaled Commercial Memories

LaBel, Kenneth A., Ladbury, Ray L., Cohn, Lewis M., Oldham, Timothy R.
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Volume:
55
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2008.2001481
Date:
August, 2008
File:
PDF, 2.51 MB
english, 2008
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