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[IEEE Comput. Soc. Press ETC 93 Third European Test Conference - Rotterdam, Netherlands (19-22 April 1993)] Proceedings ETC 93 Third European Test Conference - Absolute dynamic measurements of temperature changes in electronic components from a thermoreflectance optical test probe
Claeys, W., Dilhaire, S., Quintard, V., Dom, J.P.Year:
1993
Language:
english
DOI:
10.1109/etc.1993.246579
File:
PDF, 533 KB
english, 1993