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[IEEE Innovation in Technology Management. The Key to Global Leadership. PICMET '97 - Portland, OR, USA (27-31 July 1997)] Innovation in Technology Management. The Key to Global Leadership. PICMET '97 - Experiences from facilitating the design and implementation of performance measurement systems-the influence of the team and its leader
Bourne, M., Neely, A., Bicheno, J., Hamblin, D., Wilcox, M.Year:
1997
Language:
english
DOI:
10.1109/picmet.1997.653642
File:
PDF, 103 KB
english, 1997