Enhanced Accuracy of Force Application for AFM...

IEEE Sensors Journal 2008 / 08 Vol. 8; Iss. 8

Enhanced Accuracy of Force Application for AFM Nanomanipulation Using Nonlinear Calibration of Optical Levers

Xie, Hui, Vitard, Julien, Haliyo, Dogan Sinan, Regnier, StÉphane
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
8
Language:
english
Journal:
IEEE Sensors Journal
DOI:
10.1109/jsen.2008.920722
Date:
August, 2008
File:
PDF, 796 KB
english, 2008
Conversion to is in progress
Conversion to is failed