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[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - SoC Testing Using LFSR Reseeding, and Scan-Slice- Based TAM Optimization and Test Scheduling
Wang, Zhanglei, Chakrabarty, Krishnendu, Wang, SeongmoonYear:
2007
Language:
english
DOI:
10.1109/date.2007.364591
File:
PDF, 290 KB
english, 2007