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[IEEE Comput. Soc 23rd IEEE VLSI Test Symposium - Palm Springs, CA, USA (1-5 May 2005)] 23rd IEEE VLSI Test Symposium (VTS'05) - Modeling and Testing of SRAM for New Failure Mechanisms Due to Process Variations in Nanoscale CMOS
Qikai Chen,, Mahmoodi, H., Bhunia, S., Roy, K.Year:
2005
DOI:
10.1109/vts.2005.58
File:
PDF, 663 KB
2005