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[IEEE 2004 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Grapevine, TX, USA (2004.09.19-2004.09.23)] 2004 Electrical Overstress/Electrostatic Discharge Symposium - Latchup test-induced failure within ESD protection diodes in a high-voltage CMOS IC product
Lin, I-Cheng, Chao, Chuan-Jane, Ker, Ming-Dou, Tseng, Jen-Chou, Hsu, Chung-Ti, Leu, Len-Yi, Chen, Yu-Lin, Tsai, Chia-Ku, Huang, Ren-WenYear:
2004
Language:
english
DOI:
10.1109/eosesd.2004.5272617
File:
PDF, 594 KB
english, 2004