[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - Optimal scan for pipelined testing: an asynchronous foundation
Roncken, M., Aarts, E., Verhaegh, W.Year:
1996
Language:
english
DOI:
10.1109/test.1996.556964
File:
PDF, 1.11 MB
english, 1996