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[IEEE 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Arlington, VA, USA (2006.10.4-2006.10.4)] 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - A Novel Methodology for Functional Test Data Compression
Hashempour, Hamidreza, Lombardi, FabrizioYear:
2006
Language:
english
DOI:
10.1109/dft.2006.9
File:
PDF, 160 KB
english, 2006