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[IEEE 2010 IEEE International Conference on Rfid-Technology and Applications (RFID-TA) - Guangzhou, China (2010.06.17-2010.06.19)] 2010 IEEE International Conference on RFID-Technology and Applications - An approach to test security of EPCglobal class 1 generation 2 RFID system
Hongsheng, Zhao, Jie, Tan, Zhiyuan, ZhuYear:
2010
Language:
english
DOI:
10.1109/rfid-ta.2010.5529864
File:
PDF, 108 KB
english, 2010