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Analysis of the impact of process variations on clock skew
Zanella, S., Nardi, A., Neviani, A., Quarantelli, M., Saxena, S., Guardiani, C.Volume:
13
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/66.892625
Date:
January, 2000
File:
PDF, 99 KB
english, 2000