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[IEEE 2008 Formal Methods in Computer-Aided Design (FMCAD) - Portland, OR, USA (2008.11.17-2008.11.20)] 2008 Formal Methods in Computer-Aided Design - A Theory of Mutations with Applications to Vacuity, Coverage, and Fault Tolerance
Kupferman, Orna, Li, Wenchao, Seshia, Sanjit A.Year:
2008
Language:
english
DOI:
10.1109/fmcad.2008.ecp.29
File:
PDF, 220 KB
english, 2008