![](/img/cover-not-exists.png)
[IEEE 2005 IEEE International SOI - Honolulu, HI, USA (03-06 Oct. 2005)] 2005 IEEE International SOI Conference Proceedings - Transport and Leakage in Super-Critical Thickness Strained Silicon Directly on Insulator MOSFETs with Strained Si Thickness up to 135 nm
Aberg, I., Cheng, Z., Langdo, T.A., Lauer, I., Lochtefeld, A., Antoniadis, D.A., Hoyt, J.L.Year:
2005
Language:
english
DOI:
10.1109/soi.2005.1563521
File:
PDF, 914 KB
english, 2005