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[IEEE Comput. Soc AIPR 2000, 29th Applied Imagery Pattern Recognition Workshop - Washington, DC, USA (16-18 Oct. 2000)] Proceedings 29th Applied Imagery Pattern Recognition Workshop - Image quality assessment of sparse aperture designs
Fiete, R., Tantalo, T., Calus, J., Mooney, J.Year:
2000
Language:
english
DOI:
10.1109/aiprw.2000.953634
File:
PDF, 545 KB
english, 2000