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[IEEE Comput. Soc 18th IEEE VLSI Test Symposium - Montreal, Que., Canada (30 April-4 May 2000)] Proceedings 18th IEEE VLSI Test Symposium - Cold delay defect screening
Chao-Wen Tseng,, Mccluskey, E.J., Xiaoping Shao,, Wu, D.M.Year:
2000
Language:
english
DOI:
10.1109/vtest.2000.843843
File:
PDF, 81 KB
english, 2000