[IEEE 2008 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2008) - Hakone-Machi, Kanagawa (2008.09.9-2008.09.11)] 2008 International Conference on Simulation of Semiconductor Processes and Devices - Statistical analysis of random telegraph noise in CMOS image sensors
Jun-Myung Woo,, Hong-Hyun Park,, Hong Shick Min,, Park, Young June, Sung-Min Hong,, Chan Hyeong Park,Year:
2008
Language:
english
DOI:
10.1109/sispad.2008.4648241
File:
PDF, 683 KB
english, 2008