[IEEE Eleventh IEEE European Test Symposium (ETS'06) -...

  • Main
  • [IEEE Eleventh IEEE European Test...

[IEEE Eleventh IEEE European Test Symposium (ETS'06) - Southampton, UK (21-21 May 2006)] Eleventh IEEE European Test Symposium (ETS'06) - Testing Active Neighborhood Pattern-Sensitive Faults of Ternary Content Addressable Memories

Yu-Jen Huang,, Jin-Fu Li,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2006
Language:
english
DOI:
10.1109/ets.2006.46
File:
PDF, 211 KB
english, 2006
Conversion to is in progress
Conversion to is failed