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[IEEE Eleventh IEEE European Test Symposium (ETS'06) - Southampton, UK (21-21 May 2006)] Eleventh IEEE European Test Symposium (ETS'06) - Testing Active Neighborhood Pattern-Sensitive Faults of Ternary Content Addressable Memories
Yu-Jen Huang,, Jin-Fu Li,Year:
2006
Language:
english
DOI:
10.1109/ets.2006.46
File:
PDF, 211 KB
english, 2006