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[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Die-package stress interaction impact on transistor performance
Leatherman, Gerald S., Xu, Jessica, Hicks, Jeffrey, Kilic, Bahattin, Pantuso, DanielYear:
2012
Language:
english
DOI:
10.1109/irps.2012.6241791
File:
PDF, 657 KB
english, 2012