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[IEEE 2013 IEEE 11th International Conference on Industrial Informatics (INDIN) - Bochum, Germany (2013.07.29-2013.07.31)] 2013 11th IEEE International Conference on Industrial Informatics (INDIN) - Distributed power semiconductor stress test & measurement architecture
Steinwender, Benjamin, Einspieler, Sascha, Glavanovics, Michael, Elmenreich, WilfriedYear:
2013
Language:
english
DOI:
10.1109/indin.2013.6622870
File:
PDF, 2.24 MB
english, 2013