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[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Dynamic HC-induced degradation in n-type poly-Si thin film transistors under off-state gate pulse voltage
Wang, Huaisheng, Wang, Mingxiang, Zhang, MengYear:
2013
Language:
english
DOI:
10.1109/ipfa.2013.6599186
File:
PDF, 224 KB
english, 2013