[IEEE 2009 10th Latin American Test Workshop - Rio de Janeiro, Brazil (2009.03.2-2009.03.5)] 2009 10th Latin American Test Workshop - High-Level Decision Diagrams based coverage metrics for verification and test
Jenihhin, Maksim, Raik, Jaan, Chepurov, Anton, Reinsalu, Uljana, Ubar, RaimundYear:
2009
Language:
english
DOI:
10.1109/latw.2009.4813792
File:
PDF, 165 KB
english, 2009