![](/img/cover-not-exists.png)
[IEEE 2010 5th IEEE Conference on Industrial Electronics and Applications (ICIEA) - Taichung, Taiwan (2010.06.15-2010.06.17)] 2010 5th IEEE Conference on Industrial Electronics and Applications - Study on test generation and diagnosis optimization algorithm for wiring interconnects
Yang Chunling,, Huang Liangang,, Zhu Min,Year:
2010
Language:
english
DOI:
10.1109/iciea.2010.5517080
File:
PDF, 225 KB
english, 2010