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[IEEE 2011 Ieee Workshop On Computational Intelligence For Visual Intelligence - Part Of 17273 - 2011 Ssci - Paris, France (2011.04.11-2011.04.15)] 2011 IEEE Workshop on Computational Intelligence for Visual Intelligence (CIVI) - Automated analysis of leaf venation patterns
Mounsef, Jinane, Karam, LinaYear:
2011
Language:
english
DOI:
10.1109/civi.2011.5955019
File:
PDF, 274 KB
english, 2011