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[IEEE 2008 37th IEEE Applied Imagery Pattern Recognition Workshop - Washington, DC, USA (2008.10.15-2008.10.17)] 2008 37th IEEE Applied Imagery Pattern Recognition Workshop - Exploitation of massive numbers of simple events
Rimey, Ray, Keefe, DanYear:
2008
Language:
english
DOI:
10.1109/aipr.2008.4906460
File:
PDF, 3.12 MB
english, 2008