[IEEE 2005 IEEE International SOI - Honolulu, HI, USA...

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[IEEE 2005 IEEE International SOI - Honolulu, HI, USA (03-06 Oct. 2005)] 2005 IEEE International SOI Conference Proceedings - Stress Technology Impact on Device Performance and Reliability for <100> sub-90nm SOI CMOSFETs

Wen-Kuan Yeh,, Chieh-Ming Lai,, Chien-Ting Lin,, Yean-Kuen Fang,, Shiau, W.T.
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Year:
2005
Language:
english
DOI:
10.1109/soi.2005.1563553
File:
PDF, 1.02 MB
english, 2005
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