Electric-Field Enhancement of a Gate-All-Around Nanowire...

IEEE Electron Device Letters 2010 / 03 Vol. 31; Iss. 3

Electric-Field Enhancement of a Gate-All-Around Nanowire Thin-Film Transistor Memory

Po-Chun Huang,, Lu-An Chen,, Jeng-Tzong Sheu,
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Volume:
31
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2009.2038177
Date:
March, 2010
File:
PDF, 434 KB
english, 2010
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