[IEEE 12th European Microwave Conference, 1982 - Helsinki, Finland (1982.10.4-1982.10.6)] 12th European Microwave Conference, 1982 - Improvements in Receiver RF Burnout Characteristics and Reduction of Post Overload Degradations in Low Noise GaAs FETs
Finlay, H.J., Roberts, B.Year:
1982
Language:
english
DOI:
10.1109/euma.1982.333150
File:
PDF, 6.04 MB
english, 1982