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[Automatic RF Tech. Group 52nd ARFTG Conference Digest. Automatic RF Techniques Group. Computer-Aided Design and Test for High-Speed Electronics - Rohnert Park, CA, USA (3-4 Dec. 1998)] 52nd ARFTG Conference Digest. Automatic RF Techniques Group. Computer-Aided Design and Test for High-Speed Electronics (IEEE Cat. No.98EX245) - Diagnostic of high speed analog circuits using DC conditions
Gracios Marin, C.A., Sarmiento Reyes, L.A.Year:
1998
Language:
english
DOI:
10.1109/arftg.1998.768624
File:
PDF, 292 KB
english, 1998