[IEEE 13th Asian Test Symposium - Kenting, Taiwan (15-17 Nov. 2004)] 13th Asian Test Symposium - On Test and Diagnostics of Flash Memories
Chih-Tsun Huang,, Jen-Chieh Yeh,, Yuan-Yuan Shih,, Rei-Fu Huang,, Cheng-Wen Wu,Year:
2004
Language:
english
DOI:
10.1109/ats.2004.65
File:
PDF, 1.18 MB
english, 2004