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[IEEE 2010 International SoC Design Conference (ISOCC 2010) - Incheon, Korea (South) (2010.11.22-2010.11.23)] 2010 International SoC Design Conference - Leakage reduction of sub-55nm SRAM based on a feedback monitor scheme for standby voltage scaling
Wu, Chen, Zhang, Lijun, Lu, Zhenghao, Ma, Yaqi, Zheng, JianbinYear:
2010
Language:
english
DOI:
10.1109/socdc.2010.5682907
File:
PDF, 123 KB
english, 2010