[ACM 33rd Design Automation Conference - Las Vegas, NV, USA (3-7 June 1996)] 33rd Design Automation Conference Proceedings, 1996 - Hierarchical electromigration reliability diagnosis for VLSI interconnects
Chin-Chi Teng,, Yi-Kan Cheng,, Rosenbaum, E., Sung-Mo Kang,Year:
1996
Language:
english
DOI:
10.1109/dac.1996.545673
File:
PDF, 666 KB
english, 1996