ASIC wafer test system for the ATLAS Semiconductor Tracker...

IEEE Transactions on Nuclear Science 2002 / 06 Vol. 49; Iss. 3

ASIC wafer test system for the ATLAS Semiconductor Tracker front-end chip

Anghinolfi, F., Bialas, W., Busek, N., Ciocio, A., Cosgrove, D., Fadeyev, V., Flacco, C., Gilchriese, M., Grillo, A.A., Haber, C., Kaplon, J., Lacasta, C., Murray, W., Niggli, H., Pritchard, T., Rosen
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Volume:
49
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2002.1039618
Date:
June, 2002
File:
PDF, 215 KB
english, 2002
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