[IEEE 26th IEEE VLSI Test Symposium (vts 2008) - San Diego, CA, USA (2008.04.27-2008.05.1)] 26th IEEE VLSI Test Symposium (vts 2008) - A Novel ATPG Framework to Detect Weight Related Defects in Threshold Logic Gates
Goparaju, Manoj Kumar, Tragoudas, SpyrosYear:
2008
Language:
english
DOI:
10.1109/vts.2008.43
File:
PDF, 249 KB
english, 2008