[IEEE 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Osaka, Japan (2013.3.25-2013.3.28)] 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Electrical and mechanical characterizations of a large-area, printed organic transistor active matrix with floating-gate-based nonuniformity compensator

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