Studies of ferroelectric heterostructure thin films and...

Integrated Ferroelectrics 2000 / 03 Vol. 28; Iss. 1-4

Studies of ferroelectric heterostructure thin films and interfaces, via in situ analytical techniques

Auciello, Orlando, Krauss, Alan R., Im, Jaemo, Dhote, Anil, Gruen, Dieter M., Irene, Eugene A., Gao, Ying, Mueller, Alex H., Ramesh, Ramamoorthy
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Volume:
28
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580008222216
Date:
March, 2000
File:
PDF, 773 KB
english, 2000
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