Temperature Dependence of Submicrometer Strained-Si Surface...

IEEE Electron Device Letters 2004 / 05 Vol. 25; Iss. 5

Temperature Dependence of Submicrometer Strained-Si Surface Channel n-Type MOSFETs in DT Mode

Gaspari, V., Fobelets, K., Ding, P.W., Velazquez-Perez, J.E., Olsen, S.H., O'Neill, A.G., Zhang, J.
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Volume:
25
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2004.827286
Date:
May, 2004
File:
PDF, 150 KB
english, 2004
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