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[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Embedding Current Monitoring in H-Tree RAM Architecture for Multiple SEU Tolerance and Reliability Improvement
Argyrides, Costas, Vargas, Fabian, Moraes, Marlon, Pradhan, Dhiraj K.Year:
2008
Language:
english
DOI:
10.1109/iolts.2008.36
File:
PDF, 396 KB
english, 2008