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[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Clock Gate Test Points

Devta-Prasanna, Narendra, Gunda, Arun
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Year:
2010
Language:
english
DOI:
10.1109/test.2010.5699208
File:
PDF, 378 KB
english, 2010
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