[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Clock Gate Test Points
Devta-Prasanna, Narendra, Gunda, ArunYear:
2010
Language:
english
DOI:
10.1109/test.2010.5699208
File:
PDF, 378 KB
english, 2010