![](/img/cover-not-exists.png)
[IEEE 2010 3rd Electronic System-Integration Technology Conference (ESTC) - Berlin, Germany (2010.09.13-2010.09.16)] 3rd Electronics System Integration Technology Conference ESTC - Application of multi-criteria optimization algorithms to numerical material extraction of thin layers through nanoindentaion technique
Dowhan, Lukasz, Wymyslowski, Artur, Janus, Pawel, Ekwinska, Magdalena, Wittler, OlafYear:
2010
Language:
english
DOI:
10.1109/estc.2010.5642971
File:
PDF, 2.30 MB
english, 2010