[IEEE 2010 24th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV) - Braunschweig, Germany (2010.08.30-2010.09.3)] 24th ISDEIV 2010 - Significance of microstructure analysis for performance evaluation of Vacuum interrupter contacts
Rayudu, Srinivas, Shanker, Pranav, Nemade, Janamejay, Kulkarni, Sandeep, Andrews, L.Year:
2010
Language:
english
DOI:
10.1109/deiv.2010.5625770
File:
PDF, 795 KB
english, 2010