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[IEEE IEEE International Integrated Reliability Workshop - Lake Tahoe, CA, USA (21-24 Oct. 2002)] IEEE International Integrated Reliability Workshop Final Report, 2002. - Comparison of low leakage and high speed deep submicron PMOSFETs submitted to hole injections
Bravaix, A., Goguenheim, D., Revil, N., Vincent, E.Year:
2002
Language:
english
DOI:
10.1109/irws.2002.1194225
File:
PDF, 523 KB
english, 2002