[IEEE 2012 Future of Instrumentation International Workshop (FIIW) - Gatlinburg, TN, USA (2012.10.8-2012.10.9)] 2012 Future of Instrumentation International Workshop (FIIW) Proceedings - Wide-area power system frequency measurement applications
Markham, Penn, Zhang, Ye, Liu, Yilu, Stovall, John, Young, Marcus, Gracia, Jose, King, ThomasYear:
2012
Language:
english
DOI:
10.1109/fiiw.2012.6378340
File:
PDF, 1.47 MB
english, 2012