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[IEEE 20th Biennial Conference on Precision Electromagnetic Measurements - Braunschweig, Germany (17-21 June 1996)] Proceedings of 20th Biennial Conference on Precision Electromagnetic Measurements - International intercomparison of silicon density standards
Bettin, H., Glaser, M., Spieweck, F., Toth, H., Sacconi, A., Peuto, A., Fujii, K., Tanaka, M., Nezu, Y.Year:
1996
Language:
english
DOI:
10.1109/cpem.1996.546669
File:
PDF, 121 KB
english, 1996