[IEEE 2006 NORCHIP - Linkoping, Sweden (2006.11.20-2006.11.21)] 2006 NORCHIP - 1/f Noise Characterization in CMOS Transistors in 0.13-m Technology
Citakovic, Jelena, Stenberg, Lars J., Andreani, PietroYear:
2006
Language:
english
DOI:
10.1109/norchp.2006.329249
File:
PDF, 4.15 MB
english, 2006