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[IEEE 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Portland, OR, USA (May 12-16, 2003)] Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - High-gradient tests on S-band 2M-long accelerating structures for KEKB injector Linac
Igarashi, Y., Yamaguchi, S., Higashi, Y., Enomoto, A., Oogoe, T., Kakihara, K., Ohsawa, S., Tomizawa, H., Taniuchi, T., Hanaki, H.Volume:
5
Year:
2003
Language:
english
DOI:
10.1109/pac.2003.1289738
File:
PDF, 211 KB
english, 2003