[IEEE Fifth International Conference on Solid-State and Integrated Circuit Technology-ICSICT'98 - Beijing, China (21-23 Oct. 1998)] 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105) - The effect of cobalt salicide on SOI CMOS radiation characteristics
Xing Zhang,, Xuemei Xi,, Ru Huang,, Yangyuan Wang,Year:
1998
Language:
english
DOI:
10.1109/icsict.1998.785789
File:
PDF, 168 KB
english, 1998